A wafer contains 100 dies. You are told 1 die is “super-leaky” (consumes 10x power). You have a probe that can test any group of dies together to measure their combined power. What is the minimum number of tests to find the leaky die?
Answer: B
Explanation: This is a binary search problem. In each test, you can split the group in half (100 → 50 → 25 …). Since 2^6 = 64 and 2^7 = 128, you need 7 tests (log_2(100)) to isolate a single faulty unit.
